TY  - BOOK
AU  - Bunke Horst
AU  - Kandel Abraham
AU  - Last Mark
TI  - Applied pattern recognition
SN  - 978-3-540-76830-2
U1  - 006.4 
PY  - 2008///
CY  - Berlin
PB  - Springer-Verlag
KW  - Computer vision
KW  - Pattern recognition systems
ER  -