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21. Statistical performance analysis and modeling techniques for nanometer VLSI designs / Ruijing Shen, Sheldon X.-D. Tan, Hao Yu.

by Shen, Ruijing | Tan, Sheldon X. D | Yu, Hao.

Material type: Text Text; Format: print ; Literary form: Not fiction Availability: Items available for loan: [Call number: 621.395 Sh546] (1).
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