000 00505nam a2200169Ia 4500
008 131223s9999 xx 000 0 und d
040 _aISI KOLKATA
041 _aEnglish
082 _a000SA.53
_bN432
100 _aNelson Wayne
245 _aAccelarated testing
_bstatistical models
260 _aNew York
_bJohn Wiley
_c1990
300 _axiv,601p.
440 _aWiley series in probability and mathematical statistics. Applied Probability and Statistics
650 _aStatistical models
942 _cBK
999 _c7551
_d7551