VLSI Test principles and architectures design for testability

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Material type: Text

TextLanguage: English Series: Morgan Kauffman series in systems on siliconPublication details: Amsterdam Morgan Kaufmann 2006Description: xxx,777pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	ISI Library, Kolkata	621.395 W246 (Browse shelf(Opens below))	Available		127493

Total holds: 0

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Previous	621.395 St924 Priori wire length estimates for digital design	621.395 St925 Designer's guide to built-in self-test	621.395 T514 Spectral techniques in VLSI CAD	621.395 W246 VLSI Test principles and architectures	621.395 W855 FPGA -based system design	621.395 Y37 Practical low power digital VLSI design	621.395 Y46 Low-voltage, low-power VLSI subsystems	Next

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